Research Article

Optimal Constant-Stress Accelerated Degradation Test Plans Using Nonlinear Generalized Wiener Process

Table 2

Comparisons of four degradation models with the degradation data of LEDs.

AIC

1.28890.31201831.70.00710.02704241.6−8473.2
0.01500.00181878.90.00210.01603685.3−7360.6
1.37810.00011853.10.0263691.2−7374.4
1.36291851.20.0100.02604156.9−8305.8

Remark : “—” means that the estimate does not exist in that case.