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Mathematical Problems in Engineering
Volume 2018, Article ID 9714206, 11 pages
https://doi.org/10.1155/2018/9714206
Research Article

Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient

1School of Instrumentation Science and Opto-Electronics Engineering, Beihang University, 37 Xueyuan Road, Beijing 100191, China
2School of Physics and Electronic Information, Huaibei Normal University, 100 Dongshan Road, Huaibei 235000, China

Correspondence should be addressed to Qingfeng Ma; moc.qq@efiqam

Received 17 September 2017; Revised 20 December 2017; Accepted 8 January 2018; Published 4 February 2018

Academic Editor: Konstantinos Karamanos

Copyright © 2018 Qingfeng Ma et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Qingfeng Ma, Yuzhu He, Fuqiang Zhou, and Ping Song, “Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient,” Mathematical Problems in Engineering, vol. 2018, Article ID 9714206, 11 pages, 2018. https://doi.org/10.1155/2018/9714206.