On the Increase in Signal Depth due to High-Order Effects in Micro- and Nanosized Deformable Conductors

<div>The behavior of the parameter <svg height="6.34998pt" id="M209" style="vertical-align:-0.2063899pt" version="1.1" viewbox="-0.0498162 -6.14359 7.47218 6.34998" width="7.47218pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M548 455L523 469C505 448 490 439 461 439C416 439 374 447 316 447C144 447 23 310 23 161C23 47 89 -12 179 -12C312 -12 429 106 429 244C429 303 419 344 368 386L371 388C404 383 440 378 474 378C507 378 530 411 548 455ZM350 274C350 191 308 25 198 25C144 25 108 75 108 157C108 264 170 395 276 395C296 395 320 384 333 360C347 334 350 316 350 274Z"></path></g></svg> with respect to both the relaxation times <svg height="9.14241pt" id="M210" style="vertical-align:-3.1815pt" version="1.1" viewbox="-0.0498162 -5.96091 11.9436 9.14241" width="11.9436pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M471 456L444 459C426 433 414 430 388 430C324 430 270 434 216 434C103 434 51 374 23 338L43 317C96 366 146 380 221 375L154 109C149 86 147 68 147 52C147 4 168 -12 197 -12C240 -12 291 25 334 71L320 96C295 75 268 58 252 58C238 58 227 79 238 138C251 211 272 296 292 372C310 372 332 368 350 368C391 368 421 369 434 371C444 388 455 413 471 456Z"></path></g><g transform="matrix(.0091,0,0,-0.0091,5.434,3.132)"><path d="M655 676H628C608 656 600 650 571 650H156C118 650 114 651 102 676H77C63 615 45 548 24 485L60 486C81 531 97 562 114 580C134 603 148 611 252 611H308L217 127C201 41 196 38 105 32L98 0H384L393 32C300 38 288 41 304 127L393 611H466C553 611 571 604 582 580C592 559 597 530 595 485L630 489C636 548 645 624 655 676Z"></path></g></svg> and <span class="nowrap"><svg height="11.4351pt" id="M211" style="vertical-align:-5.47419pt" version="1.1" viewbox="-0.0498162 -5.96091 10.6101 11.4351" width="10.6101pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M471 456L444 459C426 433 414 430 388 430C324 430 270 434 216 434C103 434 51 374 23 338L43 317C96 366 146 380 221 375L154 109C149 86 147 68 147 52C147 4 168 -12 197 -12C240 -12 291 25 334 71L320 96C295 75 268 58 252 58C238 58 227 79 238 138C251 211 272 296 292 372C310 372 332 368 350 368C391 368 421 369 434 371C444 388 455 413 471 456Z"></path></g><g transform="matrix(.0091,0,0,-0.0091,5.434,3.132)"><path d="M481 430L460 436C440 442 393 451 366 451C348 451 325 448 313 446C267 437 195 409 147 367C79 308 24 211 24 105C24 37 56 -12 93 -12C121 -12 156 1 199 32C246 66 313 122 349 168H351L286 -147C274 -205 261 -215 210 -224L199 -226L193 -255L438 -243L442 -214L417 -212C364 -208 359 -200 370 -140L433 204C455 324 469 389 481 430ZM391 385C382 336 366 260 358 238C321 178 209 59 143 59C129 59 115 83 115 131C115 207 152 317 220 373C243 392 282 403 314 403C348 403 374 395 391 385Z"></path></g></svg>.</span></div>

Mathematical Problems in Engineering

fig1

Figure 1

Figure 1: On the Increase in Signal Depth due to High-Order Effects in Micro- and Nanosized Deformable Conductors 