Optimization of the Accelerated Degradation Test Plan for Electrical Connector Contact Pairs Based on a Nonlinear Wiener Process

Table 1

The optimal design plan of stress level .

The optimal design plan of stress level
Temperature stress T (°C)	Sample distribution ratio	Test frequency ()	Specific test time t (h)	Variance factor
119	0.571	1.9	6.86	0.89
			54.88
			185.22
			5000
			138		0.132	0.81	0.53
4.24
14.31
4908.33
158	0.296	0.81					0.53
			4.24
			14.31
			4908.33