Optimization of the Accelerated Degradation Test Plan for Electrical Connector Contact Pairs Based on a Nonlinear Wiener Process

Table 2

The optimal design plan of stress level .

The optimal design plan of stress level
Temperature stress T (°C)	Sample distribution ratio	Test frequency ()	Specific test time t (h)	Variance factor
119	0.545	1.9	6.86	1.02
			54.88
			185.22
			5000
			132		0.125	0.9	0.729
5.8
19.68
5000
144	0.132	0.85					0.61
			5.49
			16.47
			4880
			158		0.197	0.81	0.53
4.24
14.31
4908.33