Research Article
Optimization of the Accelerated Degradation Test Plan for Electrical Connector Contact Pairs Based on a Nonlinear Wiener Process
Table 3
The optimal design plan of stress level
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| The optimal design plan of stress level | Temperature stress T (°C) | Sample distribution ratio | Test frequency () | Specific test time t (h) | Variance factor |
| 119 | 0.483 | 1.9 | 6.86 | 1.17 | 54.88 | 185.22 | | 50000 | 128 | 0.127 | 1.06 | 1.19 | 9.52 | 32.13 | | 4874.24 | 138 | 0.13 | 0.85 | 0.61 | 4.88 | 16.47 | | 4880 | 148 | 0.127 | 0.81 | 0.53 | 4.24 | 14.31 | | 4908.33 | 158 | 0.134 | 0.81 | 0.53 | 4.24 | 14.31 | | 4908.33 |
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