Optimization of the Accelerated Degradation Test Plan for Electrical Connector Contact Pairs Based on a Nonlinear Wiener Process

Table 4

: constant stress accelerated degradation test plan.

The optimal test plan				The traditional test plan
Temperature stress T (°C)	Sample distribution ratio	Test frequency ()	Variance factor	Temperature stress T (°C)	Sample distribution ratio	Test frequency ()	Variance factor
119	0.571	1.9	0.89	105	0.333	2.29	1.03
138	0.132	0.81		130	0.333	2.29
158	0.296	0.81		158	0.333	2.29