Defect Contour Detection of Complex Structural Chips

Table 1

Comparison of assessment results.

Illumination situation	Method	Machine assessment	Artificial assessment			Total	Accuracy rate (%)	Precision rate (%)
			Qualified	Unqualified	Uncertain
Normal	Ours	Qualified	19	0	0	110	97.27	100.00
		Unqualified	0	82	2
		Uncertain	1	0	6
	YOLO v4	Qualified	19	9	0	40	75.00	67.86
		Unqualified	0	11	1
		Uncertain	0	0	0
Weak	Ours	Qualified	50	3	0	113	92.04	94.34
		Unqualified	0	49	2
		Uncertain	0	4	5
	YOLO v4	Qualified	17	14	0	40	60.00	54.84
		Unqualified	0	7	0
		Uncertain	0	2	0
Strong	Ours	Qualified	42	4	0	115	92.17	91.30
		Unqualified	0	54	0
		Uncertain	3	2	10
	YOLO v4	Qualified	20	11	0	40	72.50	64.52
		Unqualified	0	8	0
		Uncertain	0	0	1