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Modelling and Simulation in Engineering
Volume 2014, Article ID 635803, 7 pages
http://dx.doi.org/10.1155/2014/635803
Research Article

Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating Effects

SKP Engineering College, Tiruvannamalai, Tamil Nadu 606 611, India

Received 7 January 2014; Accepted 23 April 2014; Published 21 May 2014

Academic Editor: Agostino Bruzzone

Copyright © 2014 P. Anandan et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

P. Anandan, N. Malathi, and N. Mohankumar, “Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating Effects,” Modelling and Simulation in Engineering, vol. 2014, Article ID 635803, 7 pages, 2014. https://doi.org/10.1155/2014/635803.