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Volume 2017, Article ID 1020476, 7 pages
Research Article

A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled and Scans

1Sino-German Engineering College, TongJi University, Shanghai 201804, China
2Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory of the Chinese Academy of Sciences, Hefei, Anhui 230031, China
3Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, Anhui 230026, China

Correspondence should be addressed to Wenjie Meng; and Qingyou Lu; nc.ude.ctsu@lxq

Received 19 June 2017; Accepted 15 October 2017; Published 14 November 2017

Academic Editor: Masamichi Yoshimura

Copyright © 2017 Xu Chen et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


A new scan-head structure for the scanning tunneling microscope (STM) is proposed, featuring high scan precision and rigidity. The core structure consists of a piezoelectric tube scanner of quadrant type (for scans) coaxially housed in a piezoelectric tube with single inner and outer electrodes (for scan). They are fixed at one end (called common end). A hollow tantalum shaft is coaxially housed in the -scan tube and they are mutually fixed at both ends. When the scanner scans, its free end will bring the shaft to scan and the tip which is coaxially inserted in the shaft at the common end will scan a smaller area if the tip protrudes short enough from the common end. The decoupled and scans are desired for less image distortion and the mechanically reduced scan range has the superiority of reducing the impact of the background electronic noise on the scanner and enhancing the tip positioning precision. High quality atomic resolution images are also shown.