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Scanning
Volume 2017, Article ID 1020476, 7 pages
https://doi.org/10.1155/2017/1020476
Research Article

A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled and Scans

1Sino-German Engineering College, TongJi University, Shanghai 201804, China
2Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory of the Chinese Academy of Sciences, Hefei, Anhui 230031, China
3Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, Anhui 230026, China

Correspondence should be addressed to Wenjie Meng; nc.ca.lfmh@gnemjw and Qingyou Lu; nc.ude.ctsu@lxq

Received 19 June 2017; Accepted 15 October 2017; Published 14 November 2017

Academic Editor: Masamichi Yoshimura

Copyright © 2017 Xu Chen et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Xu Chen, Tengfei Guo, Yubin Hou, Jing Zhang, Wenjie Meng, and Qingyou Lu, “A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled and Scans,” Scanning, vol. 2017, Article ID 1020476, 7 pages, 2017. https://doi.org/10.1155/2017/1020476.