Research Article

Growth and Characterization of M-Plane GaN Thin Films Grown on γ-LiAlO2 (100) Substrates

Figure 2

SEM images of samples A, B, C, D, and E (a)–(e); the scale bar is 100 nm. SEM image of samples D (left) and E (right) (f); the scale bar is 10 μm.
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