Research Article
Growth and Characterization of M-Plane GaN Thin Films Grown on γ-LiAlO2 (100) Substrates
Figure 2
SEM images of samples A, B, C, D, and E (a)–(e); the scale bar is 100 nm. SEM image of samples D (left) and E (right) (f); the scale bar is 10 μm.
(a) |
(b) |
(c) |
(d) |
(e) |
(f) |