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Scanning
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2017
/
Article
/
Fig 3
/
Research Article
Growth and Characterization of
M
-Plane GaN Thin Films Grown on
γ
-LiAlO
2
(100) Substrates
Figure 3
XRD 2
θ
-
ω
scan diagrams for [11
0] azimuth (a) and
azimuth (b).
(a)
(b)