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2017
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Article
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Fig 15
/
Research Article
Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy
Figure 15
Experimental versus simulated
α
values for PS + Al
2
O
3
(
= 26 nm) and Al
2
O
3
alone (
= 18.5 nm) for different alumina thicknesses.