Scanning / 2017 / Article / Fig 4

Research Article

Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy

Figure 4

EFM normalized force contrast on a 1 μm scan over a nanodielectric of = 4, = 10, = 25 nm, and = 20 nm and at 15 nm from upper and lower surfaces; inset: capacitance model of the nanodielectric comparing center to border scan line regions.

We are committed to sharing findings related to COVID-19 as quickly and safely as possible. Any author submitting a COVID-19 paper should notify us at to ensure their research is fast-tracked and made available on a preprint server as soon as possible. We will be providing unlimited waivers of publication charges for accepted articles related to COVID-19. Sign up here as a reviewer to help fast-track new submissions.