Scanning / 2017 / Article / Fig 4

Research Article

Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy

Figure 4

EFM normalized force contrast on a 1 μm scan over a nanodielectric of = 4, = 10, = 25 nm, and = 20 nm and at 15 nm from upper and lower surfaces; inset: capacitance model of the nanodielectric comparing center to border scan line regions.

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