Scanning / 2017 / Article / Fig 8

Research Article

Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy

Figure 8

(a) Electric field intensity into a dielectric sample of 100 nm thickness and a relative permittivity of 4; (b) width of the critical interphase permittivities interval for a particle of 50 nm radius, = 10 and 20 nm interphase thickness at different depths from upper and lower surfaces.

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