Research Article
Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy
Figure 9
(a), (b), and (c) EFM detection electrical signal for PS and PS with 60 nm and 200 nm Al2O3, respectively; (d) Cross-sectional topography profiles and (e) EFM signal for studied PS particles at = 5 V and = 26 nm. Reprinted with permission from [20]. Copyright IEEE 2016.
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