Scanning / 2017 / Article / Fig 6

Research Article

Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure

Figure 6

6 keV BSE images of (a) SiO2 NP on ITO160 and (b) SiO2 NP on ITO22 taken at WD = 10 mm. The image contrast was postprocessed for optimum visibility.