Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure

<div>6 keV BSE images of (a) SiO<sub>2</sub> NP on ITO160 and (b) SiO<sub>2</sub> NP on ITO22 taken at WD = 10 mm. The image contrast was postprocessed for optimum visibility.</div>

Scanning

fig6

Figure 6

Figure 6: Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure 