Scanning / 2017 / Article / Fig 9

Research Article

Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure

Figure 9

SiO2 NP BSE contrast as a function of at 10 mm WD on (a) ITO160 and (b) ITO22. Experimental data are displayed by square symbols/solid lines; MC-simulations on the basis of Screened Rutherford are indicated by circular symbols/dashed lines and on the basis of Cz Mott cross-sections by triangular symbols/dashed lines.