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Scanning
Volume 2017, Article ID 8016571, 2 pages
https://doi.org/10.1155/2017/8016571
Editorial

In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization

1City University of Hong Kong, Kowloon, Hong Kong
2University of Toronto, Toronto, ON, Canada
3Universiti Teknologi Malaysia, Johor, Malaysia
4Arizona State University, Mesa, AZ, USA

Correspondence should be addressed to Yang Lu; kh.ude.uytic@ulgnay

Received 23 October 2017; Accepted 23 October 2017; Published 5 November 2017

Copyright © 2017 Yang Lu et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Yang Lu, Yajing Shen, Xinyu Liu, Mohd Ridzuan Bin Ahmad, and Yan Chen, “In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization,” Scanning, vol. 2017, Article ID 8016571, 2 pages, 2017. https://doi.org/10.1155/2017/8016571.