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Volume 2018 (2018), Article ID 2420747, 6 pages
Review Article

Magnetization Analysis by Spin-Polarized Scanning Electron Microscopy

Research and Development Group, Hitachi, Ltd., 2520 Akanuma, Hatoyama, Saitama 350-0395, Japan

Correspondence should be addressed to Teruo Kohashi; moc.ihcatih@cf.ihsahok.ouret

Received 2 June 2017; Revised 23 August 2017; Accepted 7 September 2017; Published 4 February 2018

Academic Editor: Peter Hedström

Copyright © 2018 Teruo Kohashi. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Spin-polarized scanning electron microscopy (spin SEM) is a method for observing magnetic-domain structures by detecting the spin polarization of secondary electrons. It has several unique abilities such as detection of full magnetization orientation and high-spatial-resolution measurement. Several spin-SEM experiments have demonstrated that it is a promising method for studying various types of magnetic materials and devices. This review paper presents several spin-SEM observations to demonstrate the capability and potential of spin SEM.