Quantifying High-Performance Material Microstructure Using Nanomechanical Tools with Visual and Frequency Analysis

Figure 1

AFM transverse-stiffness scans of (a) S3000 commercial UHMWPE fiber, (b) SK76 commercial UHMWPE fiber, (c) K29 commercial Kevlar fiber, and (d) AuTx commercial para-aramid fiber. Dark shading corresponds to a relatively compliant structure, and light shading indicates a relatively stiff structure. The image in (b) was reprinted from [15] with permission from Elsevier.