Quantifying High-Performance Material Microstructure Using Nanomechanical Tools with Visual and Frequency Analysis

Figure 2

(a) AFM schematic with red sensing laser and blue vibrational excitation laser, (b) first resonant excitation for topographical AFM scanning, and (c) second, higher-frequency resonant excitation for transverse-stiffness measurements. Equation inlay shows the relationship between transverse stiffness of the sample, , second-mode bending frequency of the AFM cantilever (shown as the peak in (c)), , second-mode bending stiffness of the AFM cantilever, , and measured change in second-mode frequency during scanning, .

(a)

(b)

(c)