Quantifying High-Performance Material Microstructure Using Nanomechanical Tools with Visual and Frequency Analysis

Figure 4

AFM (a) topography scan of SK76 UHMWPE fiber, (b) corresponding transverse-stiffness scan of the exact same area, (c) corresponding height profile along the red line in (a), and (d) corresponding stiffness profile along the red line in (b).

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