Quantifying High-Performance Material Microstructure Using Nanomechanical Tools with Visual and Frequency Analysis

Figure 8

(a) Schematic showing the lamellar persistence length, orientation angle, and first nearest neighbor metrics for UHMWPE microstructural analysis, (b) magnified sections of the S3000 and SK76 in Figure 7(a), and (c) the corresponding histograms of the three metrics for both sections of magnified fibers.

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