Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles
Typical - curves of the contact of CAFM probe to the YSZ:NP-Au/SiO2/n+-Si(100) film measured after forming by scanning at : (a) an - curve typical for the MOS structures with tunnel transparent dielectrics; (b) an - curve with NDR; (c) a cyclic - curve with the bipolar-type hysteresis; (d) a cyclic - curve with the hysteresis and NDR. The curves (c) and (d) were measured on the individual filaments.
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