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Research Article

Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles

Figure 7

Typical - curves of contact of CAFM tip to the YSZ:NP-Au/SiO2/n+-Si(100) film measured on individual filaments after forming by scanning at (a) and −6 V (b).
(a)
(b)

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