Journals
Publish with us
Publishing partnerships
About us
Blog
Scanning
Journal overview
For authors
For reviewers
For editors
Table of Contents
Special Issues
Scanning
/
2018
/
Article
/
Fig 5
/
Research Article
Three-Dimensional Atomic Force Microscopy for Sidewall Imaging Using Torsional Resonance Mode
Figure 5
The influence of the different tips (a) and SEM image of the CDR-130C tip (b). The inset is a zoom in of the flared tip.
(a)
(b)