Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy

<div>Influence of degraded high-frequency characteristics at each scan speed. (a, b) Noisy image (perfectly defocused) obtained by TV scan and its amplitude spectrum. (c, d) Noisy image (perfectly defocused) obtained by slow scan and its amplitude spectrum.</div>

Scanning

fig1

Figure 1

Figure 1: Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy 

Figure 1 | Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy 