Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy

<div>Modifying TV-scan image using inverse filter and comparison of SEM images in terms of SNR in each scan mode. (a) TV-scan image (integration of 512 images, expanded image by four times). (b) Slow-scan image. (c) Shape of inverse filter. (d) TV-scan image modified by (c).</div>

Scanning

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Figure 2

Figure 2: Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy 

Figure 2 | Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy 