Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy

<div>Confirmation of adverse effects of charging in slow-scan mode. (a) Expanded slow-scan image of Figure <a href="../fig4/">4</a>(b). (b) Expanded TV-scan image of Figure <a href="../fig4/">4</a>(d) (integrated image with position alignment). See text for details.</div>

Scanning

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Figure 5

Figure 5: Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy 

Figure 5 | Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy 