Recent Advances on SEM-Based In Situ Multiphysical Characterization of Nanomaterials

Figure 1

SEM-based in situ mechanical characterization of nanomaterials. (a) Deflection of an individual multiwalled carbon nanotube (MWCNT) using a piezoresistive atomic force microscope (AFM). (b) In situ mechanical characterization of a nanotube by buckling test. (c) Tensile test of individual MCNT, inset of (c) shows the enlarged view of MCNT under tensile force. (d) Tensile test of a single Ag NW, inset of (d) shows a high-resolution SEM image of the NW for strain measurement. (e) The AFM probe is deflecting the graphene flake while measuring the acting forces. (f) Measurement scene of nanopaper inside SEM: the top left inset shows the stretched nanopaper, and the top right inset shows the nanopaper thickness measurement.

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