Scanning Electron Microscopy versus Transmission Electron Microscopy for Material Characterization: A Comparative Study on High-Strength Steels

Figure 2

Microstructure overview for samples M12 (a), M16 (b), M23 (c), and M26 (d) as seen using bright-field TEM. Each image is resulting from a montage using several single images permitting to adjust the brightness and contrast of the field of view of each image. Due to the varying thickness over the image field of view, the bright-field contrast is dominated not only by diffraction but dramatically by the mass-thickness contrast mechanism.

(a)

(b)

(c)

(d)