Developments of Interfacial Measurement Using Cavity Scanning Microwave Microscopy

<div>Schematic diagram of the key components of a <svg height="11.439pt" id="M4" style="vertical-align:-2.15067pt" version="1.1" viewbox="-0.0498162 -9.28833 21.1173 11.439" width="21.1173pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M529 97L508 118C475 75 449 58 438 58C428 58 421 66 415 104C393 234 374 403 364 496C345 670 307 712 254 712C220 712 174 691 153 669L161 645C176 653 194 658 206 658C237 658 261 640 278 562C287 522 290 483 293 434C223 269 110 105 23 9L32 -12C59 -6 85 0 108 7C152 64 251 252 300 366C307 297 315 221 337 82C346 24 363 -12 393 -12C425 -12 475 13 529 97Z"></path></g><g transform="matrix(.013,0,0,-0.013,7.174,0)"><path d="M368 703H309L44 -163H104L368 703Z"></path></g><g transform="matrix(.013,0,0,-0.013,12.535,0)"><path d="M456 178V225H360V632H320C217 496 115 347 20 206V178H280V106C280 40 276 34 189 27V0H445V27C364 34 360 39 360 106V178H456ZM280 225H82C149 335 214 431 278 520H280V225Z"></path></g></svg> cavity-type near-field scanning microwave microscope.</div>

Scanning

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Figure 2

Figure 2: Developments of Interfacial Measurement Using Cavity Scanning Microwave Microscopy 