Developments of Interfacial Measurement Using Cavity Scanning Microwave Microscopy

<div>An enhanced grid contour image and <svg height="12.7178pt" id="M32" style="vertical-align:-3.42947pt" version="1.1" viewbox="-0.0498162 -9.28833 11.2442 12.7178" width="11.2442pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M619 670C619 686 593 712 555 712S459 686 410 634S335 504 320 430H250L219 400L222 388H312L258 73C223 -133 201 -166 187 -180C175 -191 158 -199 140 -199C123 -199 88 -188 74 -172C68 -166 63 -164 54 -171C38 -185 23 -201 23 -215C23 -236 60 -261 93 -261C122 -261 161 -247 207 -200C268 -138 300 -71 337 94C365 220 376 277 394 387L501 399L521 430H401C432 623 464 665 501 665C524 665 544 651 567 627C577 617 583 618 592 625C601 631 619 651 619 670Z"></path></g><g transform="matrix(.0091,0,0,-0.0091,6.721,3.132)"><path d="M397 380C406 395 404 411 396 425S369 451 350 451C302 451 239 372 192 294H189L199 338C214 407 207 451 180 451C152 451 83 405 30 345L48 318C87 354 117 372 125 372S135 362 127 324L55 -5L61 -12C87 -5 117 3 139 5C154 87 168 162 179 207C198 250 240 310 260 332C281 355 297 366 307 366C321 366 333 360 347 346C351 342 360 342 369 348C379 355 389 366 397 380Z"></path></g></svg> parameter image of a copper film after tilt correction [<a href="/journals/scanning/2022/1306000/#B8">8</a>].</div>

Scanning

fig6

Figure 6

Figure 6: Developments of Interfacial Measurement Using Cavity Scanning Microwave Microscopy 