Developments of Interfacial Measurement Using Cavity Scanning Microwave Microscopy

Figure 9

Images of an LSMO single-crystal taken at 6.037 GHz at a sample–probe separation of 10 μm. (a) image of the LSMO sample at an external field , chosen to give a minimum unloaded factor at the center of the sample, and (b) unloaded factor image at an external field , chosen to give a minimum at the center of the sample. A background frequency shift has been subtracted from (a). The dashed line presents the approximate location of the sample [48].

(a)

(b)