Surface Defect Detection Method Based on Improved Semisupervised Multitask Generative Adversarial Network

Table 1

The distribution of sample sizes in the PCB dataset.

Category	Training data			Test data
	Original dataset	The dataset expanded by DCGAN	The dataset expanded by iSSMT-GAN	Original dataset	DCGAN expand	iSSMT-GAN expand
Open circuit defects	140	300	300	40	100	100
Bump defects	1105	300	300	196	100	100
Hole defects	1115	300	300	204	100	100
Residual copper defects	236	300	300	97	100	100
Burr defects	127	300	300	47	100	100
Oxidation defects	200	300	300	62	100	100
Total data	2923	1800	1800	646	600	600