Research Article
Surface Defect Detection Method Based on Improved Semisupervised Multitask Generative Adversarial Network
Table 1
The distribution of sample sizes in the PCB dataset.
| Category | Training data | Test data | Original dataset | The dataset expanded by DCGAN | The dataset expanded by iSSMT-GAN | Original dataset | DCGAN expand | iSSMT-GAN expand |
| Open circuit defects | 140 | 300 | 300 | 40 | 100 | 100 | Bump defects | 1105 | 300 | 300 | 196 | 100 | 100 | Hole defects | 1115 | 300 | 300 | 204 | 100 | 100 | Residual copper defects | 236 | 300 | 300 | 97 | 100 | 100 | Burr defects | 127 | 300 | 300 | 47 | 100 | 100 | Oxidation defects | 200 | 300 | 300 | 62 | 100 | 100 | Total data | 2923 | 1800 | 1800 | 646 | 600 | 600 |
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