Detector Dead Time Determination and Optimal Counting Rate for a Detector Near a Spallation Source or a Subcritical Multiplying System

Figure 5

Distribution function 𝐼₁(𝑡) for intervals between adjacent random events (counting rate 10⁶ counts/s, 10⁹ counts in the simulation).

(a) Unperturbed distribution of time intervals and distribution of time intervals with paralyzable and non-paralyzable dead time (400 ns in any case)

(b) Distribution of time intervals for a series arrangement of a paralyzable and a non-paralyzable dead time (200 ns paralyzable and 400 ns non-paralyzable). The cases of a single paralyzable or non-paralyzable dead time (both of 400 ns) are also shown for comparison

(c) Distribution of time intervals for a series arrangement of a non-paralyzable and a paralyzable dead time (200 ns non-paralyzable and 400 ns paralyzable). The cases of a single paralyzable or non-paralyzable dead time (both of 400 ns) are also shown for comparison