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Shock and Vibration
Volume 2016, Article ID 2650569, 11 pages
http://dx.doi.org/10.1155/2016/2650569
Research Article

Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition Based on CPSD of MPI

Science and Technology on Reliability and Environmental Engineering Laboratory, Reliability and System Engineering Department, Beihang University, Beijing 100191, China

Received 22 July 2016; Revised 29 September 2016; Accepted 20 October 2016

Academic Editor: Minvydas Ragulskis

Copyright © 2016 Ying Chen et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Ying Chen, Ning Tang, and Zenghui Yuan, “Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition Based on CPSD of MPI,” Shock and Vibration, vol. 2016, Article ID 2650569, 11 pages, 2016. https://doi.org/10.1155/2016/2650569.