Research Article
A Fault Diagnosis Model Based on LCD-SVD-ANN-MIV and VPMCD for Rotating Machinery
Table 8
Comparison between different diagnosis methods.
| Method | Sample size | Feature variables | Average accuracy | Cost time |
| SSA and BP-ANN [18] | Training: 336 Testing: 144 | 4 singular values | 96.53% | — | 3 energy features | 95.14% | — |
| Multiscale entropy and SVM [23] | Training: 525 Testing: 237 | 6 entropies at different time scale | 97.42% | — |
| Envelope spectra and SVM [24] | Training: 60 Testing: 20 | 3 fault characteristic frequencies in the envelope spectra | 100% | 76.68 s |
| LCD-SVD and LSSVM | Training: Testing: | 8 singular values of ISCs | 95.23% | 146.13 s |
| LCD-SVD and VPMCD | Training: Testing: | 8 singular values of ISCs | 96.19% | 12.84 s |
| LCD-SVD-ANN-MIV and LSSVM | Training: Testing: | 4 singular values of ISCs | 96.67% | 67.42 s |
| LCD-SVD-ANN-MIV and VPMCD | Training: Testing: | 4 singular values of ISCs | 100% | 0.1028 s |
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