Research Article

A Fault Diagnosis Model Based on LCD-SVD-ANN-MIV and VPMCD for Rotating Machinery

Table 8

Comparison between different diagnosis methods.

MethodSample sizeFeature variables Average accuracy Cost time

SSA and BP-ANN [18]Training: 336
Testing: 144
4 singular values96.53%
3 energy features95.14%

Multiscale entropy and SVM [23]Training: 525
Testing: 237
6 entropies at different time scale97.42%

Envelope spectra and SVM [24]Training: 60
Testing: 20
3 fault characteristic frequencies in the envelope spectra100%76.68 s

LCD-SVD and LSSVMTraining:
Testing:
8 singular values of ISCs95.23%146.13 s

LCD-SVD and VPMCDTraining:
Testing:
8 singular values of ISCs96.19%12.84 s

LCD-SVD-ANN-MIV and LSSVMTraining:
Testing:
4 singular values of ISCs96.67%67.42 s

LCD-SVD-ANN-MIV and VPMCDTraining:
Testing:
4 singular values of ISCs100%0.1028 s