Dynamic Radiation Effects Induced by Short-Pulsed GeV U-Ion Beams in Graphite and h-BN Targets

Figure 10

Measured frequency of the bending mode as a function of fluence for h-BN irradiated with 1.14 GeV U-ions: (a) low-frequency signal around 10 kHz and (b) high-frequency signal around 40 kHz. The large signal fluctuations above 1 × 10¹³ ions/cm² are ascribed to fragmentation/detachment of the irradiated inner section of the sample. The uncertainty of the frequencies is due to the limited frequency resolution of the FFT.

(a)

(b)