Table of Contents
Textures and Microstructures
Volume 20, Issue 1-4, Pages 231-242
http://dx.doi.org/10.1155/TSM.20.231

Application of Microtexture Measurements in the SEM to Grain Boundary Parameters

Dept. of Materials Engineering, University College of Swansea, Swansea SA2 8PP, UK

Copyright © 1993 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

This paper discusses how microtexture data, i.e. individual orientations which are measured on a grain and environmentally specific basis, are applied to grain boundary geometrical parameters. Three main areas are addressed: the “interface-plane” scheme for specifying the five degress of freedom of a boundary, comparisons of experimental techniques for data collection, and representation of grain boundary misorientations in Rodrigues-Frank space. Particular attention is paid to electron back-scatter diffraction as a method of probing grain boundary misorientation and the crystallographic orientation of the grain boundary plane.