Research Article

Growth and Characterization of CuO Nanostructures on Si for the Fabrication of CuO/p-Si Schottky Diodes

Table 2

Ideality factor, barrier height, and series resistance values of the MIS structures.

Norde’s functions
(eV) (eV) (k )

Sol-gel1.58 0.790.80410
CBD2.800.790.76119