|
Short experiment name | APID | Experiment description | Provider |
|
MCPE | 1300 | Multicore processor single event upset testing | Naval Research Laboratory |
GRC experiment set | 1301 | SiC transistor health testing [12], H2 sensor, and zenith/nadir AO monitor | NASA GRC |
SEUXSE | 1302 | Xilinx FPGA SEU Testing | Sandia National Laboratory |
Not used | 1303 | | |
Not used | 1304 | | |
CIE | 1305 | CMOS imager experiment | Assurance technology |
FTSCE II | 1306 | Solar cell health monitoring [14–18] | NRL, NASA GRC, and AFRL |
Boeing ram side experiment | 1307 | Materials testing | Boeing |
HyperX | 1308 | High performance low-power processor, SEU testing [19] | NASA GSFC |
SpaceCube “A” | 1309 | Advanced processor design SEU testing [20, 21] | NASA GSFC |
SpaceCube “B” | 1310 | Advanced processor design SEU testing [20, 21] | NASA GSFC |
Wake AO fluence monitor | 1311 | Wake atomic oxygen fluence monitor/thermal control paints Experiment | NASA GRC |
Boeing wake side experiment | 1312 | Materials testing | Boeing |
AFRL wake 1 | 1313 | Tribology measurements | AFRL Dayton, U of Florida |
AFRL wake 2 | 1314 | Tribology measurements | AFRL Dayton, U of Florida |
AFRL ram 1 | 1315 | Tribology measurements | AFRL Dayton, U of Florida |
AFRL ram 2 | 1316 | Tribology measurements | AFRL Dayton, U of Florida |
iMESA | 1317 | Miniaturized electrostatic analyzer [22] | U.S. Air Force Academy |
LTESE | 1318 | Lead-free technology experiment in space environment | MSFC |
Ames | 1319 | Thermal protection systems sensors | NASA ARC, NASA LaRC, NASA JSC, and Boeing |
Boeing PICA | 1320 | Materials testing | Boeing |
Ram atomic oxygen fluence monitor/thermal control paints experiment | 1321 | | NASA GRC |
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