Journals
Publish with us
Publishing partnerships
About us
Blog
The Scientific World Journal
Journal overview
For authors
For reviewers
For editors
Table of Contents
Special Issues
The Scientific World Journal
/
2014
/
Article
/
Fig 4
/
Research Article
Growth and Etch Rate Study of Low Temperature Anodic Silicon Dioxide Thin Films
Figure 4
FTIR absorption spectra of oxide films developed under potentiostatic mode at different voltages from 50 to 250 V.