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The Scientific World Journal
Volume 2014, Article ID 281954, 8 pages
Research Article

Formation of Three-Way Scanning Electron Microscope Moiré on Micro/Nanostructures

1Research Institute of Instrumentation Frontier, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
2Hybrid Materials Unit, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan

Received 31 October 2013; Accepted 29 December 2013; Published 11 February 2014

Academic Editors: Y. Fu and G. Pedrini

Copyright © 2014 Qinghua Wang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [2 citations]

The following is the list of published articles that have cited the current article.

  • Qing Hua Wang, Shi En Ri, Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, and Yutaka Kagawa, “Fabrication of Multi-Scale Grid Patterns as Deformation Carriers in Optical Methods,” Applied Mechanics and Materials, vol. 782, pp. 271–277, 2015. View at Publisher · View at Google Scholar
  • Qinghua Wang, Hiroshi Tsuda, and Huimin Xie, “Developments and applications of moire techniques for deformation measurement, structure characterization and shape analysis,” Recent Patents on Materials Science, vol. 8, no. 3, pp. 188–207, 2015. View at Publisher · View at Google Scholar