Mechanistic Features of Nanodiamonds in the Lapping of Magnetic Heads
Figure 1
(a) Scanning electron microscopy (SEM) images of black spots, obtained with Hitachi S4800 high resolution SEM with Vacc 2.0 kV, ×40 K. (b) Atomic force microscopy (AFM) images of the corresponding black spots from the SEM images, obtained with PSIA AFM from PARK Company, Korea, using tapping mode and a scan size of μm.
