A Novel Prediction Method about Single Components of Analog Circuits Based on Complex Field Modeling
Figure 9
(a) Curve fitting of the FI degradation model about the situation that deviates from 10 k to 4 k. (b) Curve fitting of the FI degradation model about the situation that deviates from 10 k to 16 k. (c) Curve fitting of the FI degradation model about the situation that deviates from 10 k to 4 k. (d) Curve fitting of the FI degradation model about the situation that deviates from 10 k to 16 k.
