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The Scientific World Journal
Volume 2014, Article ID 729027, 13 pages
http://dx.doi.org/10.1155/2014/729027
Research Article

Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device

1Sinotech Engineering Consultants, Inc., No. 280, Xinhu 2nd Road, Neihu Distict, Taipei 11494, Taiwan
2Department of Civil Engineering, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu 300, Taiwan

Received 8 October 2013; Accepted 27 November 2013; Published 5 January 2014

Academic Editors: R. Beale and X. Cheng

Copyright © 2014 Tzu-Hsuan Lin et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [1 citation]

The following is the list of published articles that have cited the current article.

  • Wongi S. Na, “Progressive damage detection using the reusable electromechanical impedance method for metal structures with a possibility of weight loss identification,” Smart Materials and Structures, vol. 25, no. 5, 2016. View at Publisher · View at Google Scholar